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Transmission electron microscopy and atom probe tomography –Techniques and applications
Transmission electron microscopy and atom probe tomography –Techniques and applications
Transmission electron microscopy (TEM) is an essential tool both in material science and metallurgy and in the biological sciences. The basic principles of high-resolution TEM imaging (HRTEM), nanobeam electron diffraction, high-angle annular dark-field (HAADF) imaging, electron tomography and atom probe tomography will be presented, followed by examples of how each technique can solve particular problems in materials science that cannot be solved by other means.
Speaker:
Prof. Dr. Zongwen Liu
Australian Key Centre for Microscopy and Microanalysis The University of Sydney, NSW 2006, Australia
时间：2008年11月03日 10：00－11：00 (星期一）
地点：四号楼14楼第二会议室
联系人：祝迎春 许钫钫
上海硅酸盐研究所特种无机涂层重点实验室 分析测试中心
