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论文题目:
In situ TEM mechanical characterization of one-dimensional nanostructures via a standard double-tilt holder compatible MEMS device
作者:
Yang, Yang; Fu, Zhengqian; Zhang, Xiao; Cui, Yan; Xu, Fangfang; Li, Tie; Wang, Yuelin
刊物名称:
ULTRAMICROSCOPY
发表年度:
2019
卷:
期:
页码:
